X-Ray Crystallography Laboratory

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X-Ray Crystallography Laboratory

The laboratory conducts analysis of the internal structure of solids, including metallic substances, semiconductors, insulators and geological, pharmaceutical, biological and inorganic powder materials.

The laboratory also offers:

  • qualitative and quantitative phase analysis of solids, powders and thin layers samples;
  • determination of the crystal structure of substances in a wide temperature range;
  • monitoring of phase transitions;
  • Characterization of samples with high resolution by low-angle X-ray scattering of liquids, powders, solids, gel samples and fibres (SAXS); wide-angle X-ray scattering (WAXS); study of composition, structure and stress epitaxial layers; micro-diffraction measurements in capillaries with online photographic registration of the analyzed area; measurements of texture and stress, temperature-dependent measurements.
  • Examination of samples in the form of powders, thin layers, ceramics, fibres; phase identification of larger objects; qualitative and quantitative analysis of powder samples, ceramics, composites and other solids; determination of cell parameters, size of crystallites and stress in a temperature range of 12 to 1473 K
  • Examination of nano-sized sampling using the following methods: small angel scattering (SAXS), PDF analysis (pair distribution function), monitoring of crystallization „in situ”, the designation of shape and size distribution of nano-particles, high-resolution diffraction measurements; determination of crystal structure from powder samples in a temperature range of 12 to 1473 K
  • Determination of crystal structure from single-crystal samples in a temperature range of 80 to 500 K.
  • PANALYTICAL EMPYREAN WAXS/SAXS X-RAY DIFFRACTOMETER
    – high voltage generator of 4 kW, X-ray tubes Cu, Co and Ag
    – 240 mm goniometer in the vertical setup provides controlled x-ray source and detector motion with a resolution of 0.0001°and independent θ and 2 drive angles
    – scintillation point detector and semiconductor PIXcel detector on a double armscyntylacyjnego
    – high temperature chamber Anton Paar HTK1200N (298 to 1473 K) and low temperature Oxford Cryosystems PheniX (12 to 290 K)
    – changer for 15 samples, table for capillaries, 5-axis Euler cradle
    – dedicated software for diffractometer and temperature adapters control, quantitative and qualitative analysis with Rietveld analysis, analysis of stress, texture, epitaxial growth, reflectometry, easySAXS studies
    – powder diffraction database PDF-4+ and inorganic ICSD structures
    – Ball mill, hydraulic press
  • SINGLE CRYSTAL DIFFRACTOMETER SUPER NOVA (DUAL SOURCE) AGILENT TECHNOLOGIES:
    – four-circle diffractometer equipped with two micro-focus X-ray tubes: Mo and Cu
    – CCD Atlas detector with a diameter of 135 mm
    – Oxford Cryosystems Cryostream Plus (from 80 to 500 K) cryo-cooler equipped with automatic system of replenishment of liquid nitrogen dewar with a capacity of 200 L
    – dry air generator
    – dedicated software for diffractometer and temperature attachment control and data reduction θθ

Sales Department
Tel: +48 71 720 16 45
e-mail: laboratoria@eitplus.pl

Posted by Agata Kołacz, Posted on 08.10.2015
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